X-Ray Interferometry with Multicrystal Components Using Intensity Correlation

K. Tamasaku, M. Yabashi, and T. Ishikawa
Phys. Rev. Lett. 88, 044801 – Published 14 January 2002
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Abstract

A theoretical relation between intensity correlation and interference was experimentally verified for the case of a large-separation skew-symmetric bicrystal interferometer. The intensity correlation was enhanced in the angular range where the interference fringes were clearly observed. An application investigating the interference condition of the interferometer is presented using the intensity-correlation technique.

  • Received 12 June 2001

DOI:https://doi.org/10.1103/PhysRevLett.88.044801

©2002 American Physical Society

Authors & Affiliations

K. Tamasaku1, M. Yabashi2, and T. Ishikawa1,2

  • 1SPring-8/RIKEN, Mikazuki, Hyogo 679-5148, Japan
  • 2SPring-8/JASRI, Mikazuki, Hyogo 679-5198, Japan

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Issue

Vol. 88, Iss. 4 — 28 January 2002

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