Insulator at the Ultrathin Limit: MgO on Ag(001)

Silvia Schintke, Stéphane Messerli, Marina Pivetta, François Patthey, Laurent Libioulle, Massimiliano Stengel, Alessandro De Vita, and Wolf-Dieter Schneider
Phys. Rev. Lett. 87, 276801 – Published 7 December 2001
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Abstract

The electronic structure and morphology of ultrathin MgO films epitaxially grown on Ag(001) were investigated using low-temperature scanning tunneling spectroscopy and scanning tunneling microscopy. Layer-resolved differential conductance ( dI/dU) measurements reveal that, even at a film thickness of three monolayers, a band gap of about 6 eV is formed corresponding to that of the MgO(001) single-crystal surface. This finding is confirmed by layer-resolved calculations of the local density of states based on density functional theory.

  • Received 21 January 2000

DOI:https://doi.org/10.1103/PhysRevLett.87.276801

©2001 American Physical Society

Authors & Affiliations

Silvia Schintke1, Stéphane Messerli1, Marina Pivetta1, François Patthey1, Laurent Libioulle1, Massimiliano Stengel2, Alessandro De Vita2,3, and Wolf-Dieter Schneider1

  • 1Institut de Physique de la Matière Condensée, Université de Lausanne, CH-1015 Lausanne, Switzerland
  • 2Institut Romand de Recherche Numérique en Physique des Matériaux, PHH-Ecublens, CH-1015 Lausanne, Switzerland
  • 3INFM and Dipartimento di Ingegneria dei Materiali, Università di Trieste, via A. Valerio 2, 34127 Trieste, Italy

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Issue

Vol. 87, Iss. 27 — 31 December 2001

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