Femtosecond X-Ray Measurement of Ultrafast Melting and Large Acoustic Transients

K. Sokolowski-Tinten, C. Blome, C. Dietrich, A. Tarasevitch, M. Horn von Hoegen, D. von der Linde, A. Cavalleri, J. Squier, and M. Kammler
Phys. Rev. Lett. 87, 225701 – Published 7 November 2001
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Abstract

Time-resolved x-ray diffraction with ultrashort (300fs), multi-keV x-ray pulses has been used to study the femtosecond laser-induced solid-to-liquid phase transition in a thin crystalline layer of germanium. Nonthermal melting is observed to take place within 300–500 fs. Following ultrafast melting we observe strong acoustic perturbations evolving on a picosecond time scale.

  • Received 29 June 2001

DOI:https://doi.org/10.1103/PhysRevLett.87.225701

©2001 American Physical Society

Authors & Affiliations

K. Sokolowski-Tinten*, C. Blome, C. Dietrich, A. Tarasevitch, M. Horn von Hoegen, and D. von der Linde

  • Institut für Laser- und Plasmaphysik, Universität Essen, D-45117 Essen, Germany

A. Cavalleri

  • Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720

J. Squier

  • University of California at San Diego, La Jolla, California 92093-0339

M. Kammler

  • Institut für Halbleitertechnologie, Universität Hannover, 30167 Hannover, Germany

  • *Email address: kst@ilp.physik.uni-essen.de

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Vol. 87, Iss. 22 — 26 November 2001

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