Characterization of the Transverse Coherence of Hard Synchrotron Radiation by Intensity Interferometry

M. Yabashi, K. Tamasaku, and T. Ishikawa
Phys. Rev. Lett. 87, 140801 – Published 14 September 2001
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Abstract

The transverse coherence of x rays was measured with an intensity interferometer using a 120μeV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as well as the coherence degradation by a phase object in the beam path, were quantitatively characterized.

  • Received 20 June 2001

DOI:https://doi.org/10.1103/PhysRevLett.87.140801

©2001 American Physical Society

Authors & Affiliations

M. Yabashi1, K. Tamasaku2, and T. Ishikawa1,2

  • 1SPring-8/JASRI, Mikazuki, Hyogo 679-5198, Japan
  • 2SPring-8/RIKEN, Mikazuki, Hyogo 679-5148, Japan

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Issue

Vol. 87, Iss. 14 — 1 October 2001

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