Abstract
The transverse coherence of x rays was measured with an intensity interferometer using a -bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as well as the coherence degradation by a phase object in the beam path, were quantitatively characterized.
- Received 20 June 2001
DOI:https://doi.org/10.1103/PhysRevLett.87.140801
©2001 American Physical Society