Structure and Formation Mechanism of Ge E Center from Divalent Defects in Ge-doped SiO2 Glass

Takashi Uchino, Masahide Takahashi, and Toshinobu Yoko
Phys. Rev. Lett. 84, 1475 – Published 14 February 2000
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Abstract

We have performed ab initio quantum-chemical calculations on clusters of atoms modeling a divalent Ge defect in Ge-doped SiO2 glasses. It has been found that the divalent Ge defect interacts with a nearby GeO4 tetrahedron, forming complex structural units that are responsible for the observed photoabsorption band at 5eV. We have shown that these structural units can be transformed into two equivalent Ge E centers by way of the positively charged defect center.

  • Received 16 July 1999

DOI:https://doi.org/10.1103/PhysRevLett.84.1475

©2000 American Physical Society

Authors & Affiliations

Takashi Uchino*, Masahide Takahashi, and Toshinobu Yoko

  • Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan

  • *Email address: uchino@scl.kyoto-u.ac.jp

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Vol. 84, Iss. 7 — 14 February 2000

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