Oxygen-Induced Vacancy Formation on a Metal Surface

M. Schmid, G. Leonardelli, M. Sporn, E. Platzgummer, W. Hebenstreit, M. Pinczolits, and P. Varga
Phys. Rev. Lett. 82, 355 – Published 11 January 1999
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Abstract

Using scanning tunneling microscopy, low-energy ion scattering, and quantitative low-energy electron diffraction, we find about 17% metal vacancies on the oxygen-covered Cr(100) surface. The oxygen atoms occupy all the hollow sites of the first layer, including those neighboring a Cr vacancy. We argue that the vacancy formation is energetically favored and not caused by stress but by electronic effects.

  • Received 10 June 1998

DOI:https://doi.org/10.1103/PhysRevLett.82.355

©1999 American Physical Society

Authors & Affiliations

M. Schmid, G. Leonardelli, M. Sporn, E. Platzgummer, W. Hebenstreit*, M. Pinczolits, and P. Varga

  • Institut für Allgemeine Physik, TU Wien, Wiedner Hauptstrasse 8-10, A-1040, Austria

  • *Present address: Department of Physics, Tulane University, New Orleans, LA 70118.
  • Present address: Institut für Halbleiterphysik, Johannes-Kepler Universität Linz, A-4040 Linz, Austria.

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Vol. 82, Iss. 2 — 11 January 1999

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