Coulomb Charging Effect in Self-Assembled Ge Quantum Dots Studied by Admittance Spectroscopy

S. K. Zhang, H. J. Zhu, F. Lu, Z. M. Jiang, and Xun Wang
Phys. Rev. Lett. 80, 3340 – Published 13 April 1998; Erratum Phys. Rev. Lett. 82, 2622 (1999)
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Abstract

Quantum confined energy levels and the Coulomb charging effect of holes in self-assembled Ge dots embedded in Si barriers are studied using admittance spectroscopy at temperatures above 100 K. Ground state and first excited state occupancies of five to seven holes are identified by varying the Fermi-level position under different applied bias voltages in the admittance measurements. Hole-capture cross sections of the quantum levels are found to be extremely large and energy dependent.

  • Received 27 June 1997

DOI:https://doi.org/10.1103/PhysRevLett.80.3340

©1998 American Physical Society

Erratum

Authors & Affiliations

S. K. Zhang, H. J. Zhu, F. Lu, Z. M. Jiang, and Xun Wang*

  • Surface Physics Laboratory, Fudan University, Shanghai 200433, China

  • *Corresponding author. Electronic address: xunwang@fudan.ac.cn

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Vol. 80, Iss. 15 — 13 April 1998

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