Diffusion Mechanism of Si Adatoms on a Double-Layer Stepped Si(001) Surface

Eunja Kim, Chan Wuk Oh, and Young Hee Lee
Phys. Rev. Lett. 79, 4621 – Published 8 December 1997
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Abstract

Using the ab initio molecular dynamics approach we investigate the diffusion mechanism of Si adatoms on a rebonded and a nonrebonded double-layer stepped Si(001) surface. The rebonded DB step shows two Schwoebel barriers, whereas the nonrebonded step reveals a single barrier. This is due to the severe tensile strain on the surface layers parallel to the dimer row near the rebonded step edge. Adatom-step interaction is more favorable on a nonrebonded step than on a rebonded one near the ascending step. Several pathways for diffusion of an ad-dimer to the rebonded step edge from an upper terrace are examined. We find that the exchange and crossing-over processes are favored over the rolling-over process.

  • Received 2 April 1997

DOI:https://doi.org/10.1103/PhysRevLett.79.4621

©1997 American Physical Society

Authors & Affiliations

Eunja Kim, Chan Wuk Oh, and Young Hee Lee

  • Department of Physics and Semiconductor Physics Research Center, Jeonbuk National University, Jeonju 561-756, Republic of Korea

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Issue

Vol. 79, Iss. 23 — 8 December 1997

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