Abstract
The combination of in situ real-time surface differential reflectivity (SDR) spectroscopy and microscopic calculations has been used for the first time to investigate gas adsorption on a Si surface. The optical signatures of some microscopic structural units of Si(111)-( ) have been identified. The development of the corresponding features in the SDR spectra upon the amount of H exposure allowed us to demonstrate the occurrence of two different mechanisms in the hydrogenation and to determine their relative kinetics.
- Received 2 November 1995
DOI:https://doi.org/10.1103/PhysRevLett.76.4923
©1996 American Physical Society