Potential Sputtering of Lithium Fluoride by Slow Multicharged Ions

T. Neidhart, F. Pichler, F. Aumayr, HP. Winter, M. Schmid, and P. Varga
Phys. Rev. Lett. 74, 5280 – Published 26 June 1995
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Abstract

Thin polycrystalline LiF films have been bombarded by slow (1 keV) multicharged Arq+ ions (q9), in order to study the resulting total sputter yields by means of a quartz crystal microbalance. More than 99% of sputtered particles are neutral and show yields, at given impact energy, in proportion to the potential energy of projectile ions. The respective “potential sputtering” process already takes place far below 100 eV impact energy. It can be related to defect production in LiF following electron capture by the multicharged ions, and removes about one LiF molecule per 100 eV of projectile potential energy.

  • Received 9 November 1994

DOI:https://doi.org/10.1103/PhysRevLett.74.5280

©1995 American Physical Society

Authors & Affiliations

T. Neidhart, F. Pichler, F. Aumayr, HP. Winter, M. Schmid, and P. Varga

  • Institut für Allgemeine Physik, Technische Universität Wien, Wiedner Hauptstrasse, 8-10/134, A-1040 Wien, Austria

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Vol. 74, Iss. 26 — 26 June 1995

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