Bundle Formation of Polymers with an Atomic Force Microscope in Contract Mode: A Friction Versus Peeling Process

Z. Elkaakour, J. P. Aimé, T. Bouhacina, C. Odin, and T. Masuda
Phys. Rev. Lett. 73, 3231 – Published 12 December 1994
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Abstract

Among near field microscopes, the atomic force microscope appears as a powerful and versatile tool for investigating local mechanical properties. In addition, we can take advantage of the tip sample interaction, to perturb, and in turn modify the surface of soft samples. Here we report an attempt to modify the structure of a substituted polyacetylene film spread on a surface. Regular periodic patterns are obtained, and we show that scan frequency and applied load are the pertinent parameters that control the period. These results can be described as bundle formation via a peeling process.

  • Received 8 June 1994

DOI:https://doi.org/10.1103/PhysRevLett.73.3231

©1994 American Physical Society

Authors & Affiliations

Z. Elkaakour1, J. P. Aimé1,*, T. Bouhacina1, C. Odin1, and T. Masuda1,2

  • 1L.CP.C. Université Bordeaux I, 351 Cours de la Libération 33405 Talence Cedex. France
  • 2Department of Polymer Chemistry, Kyoto University, Kyoto 606-01, Japan

  • *To whom correspondence should be addressed.

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Vol. 73, Iss. 24 — 12 December 1994

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