Penetration Depth Measurements of 3D XY Critical Behavior in YBa2Cu3O6.95 Crystals

S. Kamal, D. A. Bonn, Nigel Goldenfeld, P. J. Hirschfeld, Ruixing Liang, and W. N. Hardy
Phys. Rev. Lett. 73, 1845 – Published 26 September 1994
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Abstract

We report measurements of the electromagnetic penetration depth λ(T) in nominally pure crystals of YBa2Cu3O6,95, for temperatures close to the critical temperature Tc. Over the range 0.001<(TcT)Tc<0.1, we find that λ(T)(1TTc)y with y0.33, consistent with the critical behavior of the three dimensional XY model. The measured critical behavior is not affected by the presence of small amounts of Zn impurities, in agreement with the Harris criterion.

  • Received 21 March 1994

DOI:https://doi.org/10.1103/PhysRevLett.73.1845

©1994 American Physical Society

Authors & Affiliations

S. Kamal1, D. A. Bonn1, Nigel Goldenfeld2, P. J. Hirschfeld3, Ruixing Liang1, and W. N. Hardy1

  • 1Department of Physics, University of British Columbia, Vancouver, British Columbia, Canada V6T 1Z1
  • 2Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080
  • 3Department of Physics, University of Florida, Gainesville, Florida 32611

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Vol. 73, Iss. 13 — 26 September 1994

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