Orientational dependence of the interface magnetic anisotropy in epitaxial Ni/Co/Ni sandwiches

M. T. Johnson, J. J. de Vries, N. W. E. McGee, J. aan de Stegge, and F. J. A. den Broeder
Phys. Rev. Lett. 69, 3575 – Published 14 December 1992
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Abstract

Magneto-optical Kerr effect measurements have been used to investigate the orientational dependence of the magnetic anisotropy in ultrathin Ni/Co-wedge/Ni sandwiches deposited by molecular beam epitaxy on single-crystal Cu substrates. The results show a marked dependence of both the volume and interface anisotropy terms on the growth direction of the samples: [100], [110], and [111]. In addition, the (111) interface term was found to be significantly larger than existing literature values for Co/Ni multilayers. This effect is discussed in terms of the microstructure of the studied films.

  • Received 28 August 1992

DOI:https://doi.org/10.1103/PhysRevLett.69.3575

©1992 American Physical Society

Authors & Affiliations

M. T. Johnson, J. J. de Vries, N. W. E. McGee, J. aan de Stegge, and F. J. A. den Broeder

  • Philips Research, P.O. Box 80000, 5600 JA Eindhoven, The Netherlands
  • Department of Physics, Eindhoven University of Technology, 5600 MB Eindhoven , The Netherlands

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Vol. 69, Iss. 24 — 14 December 1992

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