Early stages of grain growth in ion-irradiated amorphous silicon

C. Spinella, S. Lombardo, and S. U. Campisano
Phys. Rev. Lett. 66, 1102 – Published 25 February 1991
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Abstract

Transmission-electron-microscopy observations of silicon layers obtained by chemical vapor deposition at 540 °C onto SiO2 substrates reveal the presence of nanometer-diameter crystal seeds. Ion bombardment with 600-keV Kr ions at a temperature in the range 330–450 °C produces the growth of a fraction of these seeds that increases with the irradiation temperature. The interpretation of the results implies that phase stability is still controllled by the thermodynamic transition scheme even in the presence of the large density of defects generated during each collision cascade.

  • Received 27 November 1990

DOI:https://doi.org/10.1103/PhysRevLett.66.1102

©1991 American Physical Society

Authors & Affiliations

C. Spinella and S. Lombardo

  • Istituto di Metodologie e Tecnologie per la Microelettronica, Consiglio Nazionale delle Recherce corso Italia 57, I 95129 Catania, Italy

S. U. Campisano

  • Dipartimento di Fisica dell’Università, corso Italia 57, I 95129 Catania, Italy

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Vol. 66, Iss. 8 — 25 February 1991

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