Electrical conductivity of magnetic multilayered structures

Peter M. Levy, Shufeng Zhang, and Albert Fert
Phys. Rev. Lett. 65, 1643 – Published 24 September 1990
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Abstract

The electrical-transport properties of magnetic multilayered structures are dominated by three ingredients: (1) the scattering within layers that changes from one layer to another, (2) the additional scattering resistivity due to the roughness of the interfaces between layers, and (3) the resistivity that depends on the orientation of the magnetization of the magnetic layers. In the quasiclassical approach the boundary scattering is treated differently from other sources. Here we present a unified treatment of all sources of resistivity, and determine the origin of the giant magnetoresistance observed in Fe/Cr superlattices.

  • Received 14 March 1990

DOI:https://doi.org/10.1103/PhysRevLett.65.1643

©1990 American Physical Society

Authors & Affiliations

Peter M. Levy and Shufeng Zhang

  • Department of Physics, New York University, 4 Washington Place, New York, New York 10003

Albert Fert

  • Laboratoire de Physique des Solides, Université de Paris(enSud, Bâtiment 510, 91405 Orsay, France

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Vol. 65, Iss. 13 — 24 September 1990

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