Adsorption of boron on Si(111): Its effect on surface electronic states and reconstruction

I.-W. Lyo, Efthimios Kaxiras, and Ph. Avouris
Phys. Rev. Lett. 63, 1261 – Published 18 September 1989
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Abstract

Adsorption of B induces a (√3 × √3 )R30° reconstruction on Si(111). By combining scanning tunneling microscope topographs and spectra with first-principles calculations we are able to follow the different stages of B incorporation in the Si surface and the corresponding changes to the surface electronic states. We find that the thermodynamically stable configuration consists of a B substitutional atom directly below a Si adatom at a T4 site. The stability of this configuration is due to the relief of subsurface strain by the short B-Si bonds and the passivation of the surface obtained through charge transfer from the Si adatom to the substitutional B.

  • Received 14 April 1989

DOI:https://doi.org/10.1103/PhysRevLett.63.1261

©1989 American Physical Society

Authors & Affiliations

I.-W. Lyo, Efthimios Kaxiras, and Ph. Avouris

  • IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 63, Iss. 12 — 18 September 1989

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