Abstract
We study the variations of the electrical conductivity σ with thickness d of ultrathin metallic films. In the limit ξ≪1, where ξ is the correlation length describing the film surface roughness and is the electron Fermi wave vector, we show that σ follows a universal law, σ∼, independent of any adjustable parameter. This law accounts for recent experimental data on down to d=10 Å. Moreover, the measurements of σ are well fitted when we introduce in its theoretical expression the values of the surface roughness parameters recently estimated from electron microscopy.
- Received 20 June 1988
DOI:https://doi.org/10.1103/PhysRevLett.62.1302
©1989 American Physical Society