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Surface Studies by Scanning Tunneling Microscopy

G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel
Phys. Rev. Lett. 49, 57 – Published 5 July 1982
An article within the collection: Letters from the Past - A PRL Retrospective and the Scanning Probe Microscopy: From Sublime to Ubiquitous
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Abstract

Surface microscopy using vacuum tunneling is demonstrated for the first time. Topographic pictures of surfaces on an atomic scale have been obtained. Examples of resolved monoatomic steps and surface reconstructions are shown for (110) surfaces of CaIrSn4 and Au.

  • Received 30 April 1982

DOI:https://doi.org/10.1103/PhysRevLett.49.57

©1982 American Physical Society

Collections

This article appears in the following collections:

Letters from the Past - A PRL Retrospective

2008 marked PRL’s 50th anniversary. As part of the celebrations a collection of milestone Letters was started. The collection contains Letters that have made long-lived contributions to physics, either by announcing significant discoveries, or by initiating new areas of research.

Scanning Probe Microscopy: From Sublime to Ubiquitous

This collection marks the 35th anniversary of scanning tunneling microscopy (STM) and the 30th anniversary of atomic force microscopy (AFM). These papers, all published in the Physical Review journals, highlight the positive impact that STM and AFM have had, and continue to have, on physical science research. The papers included in the collection have been made free to read.

Authors & Affiliations

G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel

  • IBM Zurich Research Laboratory, 8803 Rüschlikon-ZH, Switzerland

References

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Issue

Vol. 49, Iss. 1 — 5 July 1982

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