Induced Magnetization in La0.7Sr0.3MnO3/BiFeO3 Superlattices

Surendra Singh, J. T. Haraldsen, J. Xiong, E. M. Choi, P. Lu, D. Yi, X.-D. Wen, J. Liu, H. Wang, Z. Bi, P. Yu, M. R. Fitzsimmons, J. L. MacManus-Driscoll, R. Ramesh, A. V. Balatsky, Jian-Xin Zhu, and Q. X. Jia
Phys. Rev. Lett. 113, 047204 – Published 24 July 2014
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Abstract

Using polarized neutron reflectometry, we observe an induced magnetization of 75±25  kA/m at 10 K in a La0.7Sr0.3MnO3 (LSMO)/BiFeO3 superlattice extending from the interface through several atomic layers of the BiFeO3 (BFO). The induced magnetization in BFO is explained by density functional theory, where the size of band gap of BFO plays an important role. Considering a classical exchange field between the LSMO and BFO layers, we further show that magnetization is expected to extend throughout the BFO, which provides a theoretical explanation for the results of the neutron scattering experiment.

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  • Received 18 July 2013

DOI:https://doi.org/10.1103/PhysRevLett.113.047204

© 2014 American Physical Society

Authors & Affiliations

Surendra Singh1,2, J. T. Haraldsen1,3, J. Xiong1,4, E. M. Choi5, P. Lu6, D. Yi7, X.-D. Wen1, J. Liu7, H. Wang8, Z. Bi1, P. Yu7, M. R. Fitzsimmons1, J. L. MacManus-Driscoll5, R. Ramesh7, A. V. Balatsky1, Jian-Xin Zhu1, and Q. X. Jia1,*

  • 1Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
  • 2Solid State Physics Division, Bhabha Atomic Research Center, Mumbai 400085, India
  • 3Department of Physics and Astronomy, James Madison University, Harrisonburg, Virginia 22807, USA
  • 4State Key Lab of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610051, China
  • 5Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, United Kingdom
  • 6Sandia National Laboratory, Albuquerque, New Mexico 87185, USA
  • 7Department of Materials Science and Engineering, University of California at Berkeley, Berkeley, California 94720, USA
  • 8Department of Electrical and Computer Engineering, Texas A&M University, College Station, Texas 77843, USA

  • *To whom all correspondence should be addressed. qxjia@lanl.gov

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Vol. 113, Iss. 4 — 25 July 2014

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