Ion Depletion Near a Solution Surface: Is Image-Charge Repulsion Sufficient?

Ulrich K. Krieger, Maurus Hess, Thomas Peter, Antonella Rossi, Nicholas D. Spencer, and William A. Lanford
Phys. Rev. Lett. 111, 266102 – Published 26 December 2013
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Abstract

Grazing-incidence Rutherford backscattering and angle-resolved x-ray photoelectron spectrometry are used to determine the ion-concentration profiles near the surface of a solution consisting of a salt (TEABr) in a weakly polar organic liquid (polyethylene glycol) with atomic-layer depth resolution. The predictions of a model, in which ions in solution are repelled from the surface due to a screened Coulomb interaction with their image charge, are in good agreement with measured ion profiles. This contrasts with the behavior of salts in aqueous and highly polar organic solutions.

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  • Received 1 July 2013

DOI:https://doi.org/10.1103/PhysRevLett.111.266102

© 2013 American Physical Society

Authors & Affiliations

Ulrich K. Krieger1,*, Maurus Hess1, Thomas Peter1, Antonella Rossi2,3, Nicholas D. Spencer2, and William A. Lanford4

  • 1Institute for Atmospheric and Climate Science, ETH Zurich, 8092 Zurich, Switzerland
  • 2Laboratory for Surface Science and Technology, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland
  • 3Dipartimento di Scienze Chimiche e Geologiche, Università degli Studi di Cagliari, 09042 Monserrato (Cagliari), Italy
  • 4Physics Department, University at Albany, Albany, New York 12222, USA

  • *ulrich.krieger@env.ethz.ch

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Vol. 111, Iss. 26 — 27 December 2013

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