In Situ Visualization of Birth and Annihilation of Grain Boundaries in an Au Nanocrystal

He Zheng, Jianbo Wang, Jian Yu Huang, Ajing Cao, and Scott X. Mao
Phys. Rev. Lett. 109, 225501 – Published 28 November 2012
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Abstract

The formation and vanishing processes of a low angle grain boundary (GB) in nanosized Au during tension and release of stress, respectively, were obsvered by in situ high resolution transmission electron microscopy. The nucleation of perfect dislocations led to the formation of a 15° low angle GB inside an Au nanocrystal upon off-axial tensile loading (coupled uniaxial tensile and bending stress). Strikingly, the dislocations were completely annihilated accompanied with the disappearance of the GB after the removal of external stress, indicating that plastic bending is recoverable in the nanocrystal. The back force and surface stress played important roles in such a pseudoelastic behavior. This transient GB dynamics cannot be captured in ex situ experimental investigations. Such pseudoelastic bending deformation in nanosized crystals will have an important impact on the designing of nanomechanical devices with ultrahigh bending capability.

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  • Received 17 April 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.225501

© 2012 American Physical Society

Authors & Affiliations

He Zheng1,2, Jianbo Wang1,*, Jian Yu Huang3,†, Ajing Cao4, and Scott X. Mao2,5,‡

  • 1School of Physics and Technology, Center for Electron Microscopy and MOE Key Laboratory of Artificial Micro- and Nano-structures, Wuhan University, Wuhan 430072, China
  • 2Department of Mechanical Engineering & Materials Science, University of Pittsburgh, Pittsburgh, Pennsylvania 15261, USA
  • 3Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
  • 4MST-8, Los Alamos National Laboratory, Los Alamos, New Mexico 87544, USA
  • 5Center for Electron Microscopy, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China

  • *wang@whu.edu.cn
  • jyhuang8@yahoo.com
  • smao@engr.pitt.edu

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Issue

Vol. 109, Iss. 22 — 30 November 2012

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