Direct-Gap Gain and Optical Absorption in Germanium Correlated to the Density of Photoexcited Carriers, Doping, and Strain

Lee Carroll, Peter Friedli, Stefan Neuenschwander, Hans Sigg, Stefano Cecchi, Fabio Isa, Daniel Chrastina, Giovanni Isella, Yuriy Fedoryshyn, and Jérôme Faist
Phys. Rev. Lett. 109, 057402 – Published 1 August 2012

Abstract

Direct-gap gain up to 850cm1 at 0.74 eV is measured and modeled in optically pumped Ge-on-Si layers for photoexcited carrier densities of 2.0×1020cm3. The gain spectra are correlated to carrier density via plasma-frequency determinations from reflection spectra. Despite significant gain, optical amplification cannot take place, because the carriers also generate pump-induced absorption of 7000cm1. Parallel studies of III–V direct-gap InGaAs layers validate our spectroscopy and modeling. Our self-consistent results contradict current explanations of lasing in Ge-on-Si cavities.

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  • Received 19 January 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.057402

© 2012 American Physical Society

Authors & Affiliations

Lee Carroll, Peter Friedli, Stefan Neuenschwander, and Hans Sigg

  • Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, CH-5232 Villigen, Switzerland

Stefano Cecchi, Fabio Isa, Daniel Chrastina, and Giovanni Isella

  • L-NESS, Dipartimento di Fisica del Politecnico di Milano, Polo di Como, Via Anzani 42, I-22100 Como, Italy

Yuriy Fedoryshyn and Jérôme Faist

  • Institute for Quantum Electronics, ETH Zurich, CH-8093 Zurich, Switzerland

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Issue

Vol. 109, Iss. 5 — 3 August 2012

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