Abstract
Direct-gap gain up to at 0.74 eV is measured and modeled in optically pumped Ge-on-Si layers for photoexcited carrier densities of . The gain spectra are correlated to carrier density via plasma-frequency determinations from reflection spectra. Despite significant gain, optical amplification cannot take place, because the carriers also generate pump-induced absorption of . Parallel studies of III–V direct-gap InGaAs layers validate our spectroscopy and modeling. Our self-consistent results contradict current explanations of lasing in Ge-on-Si cavities.
- Received 19 January 2012
DOI:https://doi.org/10.1103/PhysRevLett.109.057402
© 2012 American Physical Society