Electric Field Confinement Effect on Charge Transport in Organic Field-Effect Transistors

Xiaoran Li, Andrey Kadashchuk, Ivan I. Fishchuk, Wiljan T. T. Smaal, Gerwin Gelinck, Dirk J. Broer, Jan Genoe, Paul Heremans, and Heinz Bässler
Phys. Rev. Lett. 108, 066601 – Published 8 February 2012
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Abstract

While it is known that the charge-carrier mobility in organic semiconductors is only weakly dependent on the electric field at low fields, the experimental mobility in organic field-effect transistors using silylethynyl-substituted pentacene is found to be surprisingly field dependent at low source-drain fields. Corroborated by scanning Kelvin probe measurements, we explain this observation by the severe difference between local conductivities within grains and at grain boundaries. Redistribution of accumulated charges creates very strong local lateral fields in the latter regions. We further confirm this picture by verifying that the charge mobility in channels having no grain boundaries, made from the same organic semiconductor, is not significantly field dependent. We show that our model allows us to quantitatively model the source-drain field dependence of the mobility in polycrystalline organic transistors.

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  • Received 2 September 2011

DOI:https://doi.org/10.1103/PhysRevLett.108.066601

© 2012 American Physical Society

Authors & Affiliations

Xiaoran Li1,2, Andrey Kadashchuk3,4,*, Ivan I. Fishchuk4,5, Wiljan T. T. Smaal2, Gerwin Gelinck2, Dirk J. Broer1, Jan Genoe3, Paul Heremans3, and Heinz Bässler6

  • 1Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
  • 2Holst Centre/TNO, High Tech Campus 31, 5656 AE Eindhoven, The Netherlands
  • 3IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
  • 4Institute of Physics, National Academy of Sciences of Ukraine, Prospect Nauky 46, 03028 Kyiv, Ukraine
  • 5Institute for Nuclear Research, National Academy of Sciences of Ukraine, Prospect Nauky 47, 03680 Kyiv, Ukraine
  • 6Experimental Physics II, University of Bayreuth, 95440 Bayreuth, Germany

  • *Corresponding author. kadash@imec.be

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Issue

Vol. 108, Iss. 6 — 10 February 2012

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