Characterizing Order in Amorphous Systems

François Sausset and Dov Levine
Phys. Rev. Lett. 107, 045501 – Published 19 July 2011

Abstract

We measure and compare three correlation lengths proposed to describe the extent of structural order in amorphous systems. In particular, the recently proposed “patch correlation length” is measured as a function of temperature and fragility and shown to be comparable with other measures. In addition, we demonstrate that the patch method also allows us to characterize the symmetries of the local order without any a priori knowledge of it.

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  • Received 16 March 2011

DOI:https://doi.org/10.1103/PhysRevLett.107.045501

© 2011 American Physical Society

Authors & Affiliations

François Sausset1,2,* and Dov Levine1

  • 1Department of Physics, Technion, Haifa 32000, Israel
  • 2Univ. Paris-Sud & CNRS, LPTMS, UMR8626, Bâtiment 100, 91405 Orsay, France

  • *francois.sausset@lptms.u-psud.fr

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Issue

Vol. 107, Iss. 4 — 22 July 2011

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