Nanometer Axial Resolution by Three-Dimensional Supercritical Angle Fluorescence Microscopy

Christian M. Winterflood, Thomas Ruckstuhl, Dorinel Verdes, and Stefan Seeger
Phys. Rev. Lett. 105, 108103 – Published 31 August 2010

Abstract

We report a noninvasive fluorescence microscopy method and demonstrate nanometer resolution along the optical axis. The technique is based on the influence of the microscope slide on the angular intensity distribution of fluorescence. Axial positions are determined by measuring the proportion of light emitted below the critical angle of total internal reflection, which behaves in a classical way, and light emitted above the critical angle, which is exponentially dependent on the distance of the fluorophore from the microscope slide.

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  • Received 26 February 2010

DOI:https://doi.org/10.1103/PhysRevLett.105.108103

© 2010 The American Physical Society

Authors & Affiliations

Christian M. Winterflood, Thomas Ruckstuhl, Dorinel Verdes, and Stefan Seeger*

  • Physikalisch-Chemisches Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland

  • *s.seeger@pci.uzh.ch

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Vol. 105, Iss. 10 — 3 September 2010

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