Strong Valence Fluctuation in the Quantum Critical Heavy Fermion Superconductor βYbAlB4: A Hard X-Ray Photoemission Study

M. Okawa, M. Matsunami, K. Ishizaka, R. Eguchi, M. Taguchi, A. Chainani, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, K. Kuga, N. Horie, S. Nakatsuji, and S. Shin
Phys. Rev. Lett. 104, 247201 – Published 14 June 2010

Abstract

Electronic structures of the quantum critical superconductor βYbAlB4 and its polymorph αYbAlB4 are investigated by using bulk-sensitive hard x-ray photoemission spectroscopy. From the Yb 3d core level spectra, the values of the Yb valence are estimated to be 2.73 and 2.75 for α- and βYbAlB4, respectively, thus providing clear evidence for valence fluctuations. The valence band spectra of these compounds also show Yb2+ peaks at the Fermi level. These observations establish an unambiguous case of a strong mixed valence at quantum criticality for the first time among heavy fermion systems, calling for a novel scheme for a quantum critical model beyond the conventional Doniach picture in βYbAlB4.

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  • Received 26 June 2009

DOI:https://doi.org/10.1103/PhysRevLett.104.247201

©2010 American Physical Society

Authors & Affiliations

M. Okawa1,*, M. Matsunami1,2,†, K. Ishizaka1,‡, R. Eguchi1,2,§, M. Taguchi2, A. Chainani2, Y. Takata2, M. Yabashi2,3, K. Tamasaku2, Y. Nishino2,∥, T. Ishikawa2,3, K. Kuga1, N. Horie1, S. Nakatsuji1, and S. Shin1,2,¶

  • 1Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
  • 2RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan
  • 3Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan

  • *m-okawa@issp.u-tokyo.ac.jp
  • Present address: UVSOR Facility, Institute for Molecular Science, Okazaki, Aichi 444-8585, Japan.
  • Present address: Department of Applied Physics, University of Tokyo, Tokyo 113-8656, Japan.
  • §Present address: Graduate School of Natural Science and Technology, Okayama University, Okayama 700-8530, Japan.
  • Present address: Research Institute for Electronic Science, Hokkaido University, Sapporo 060-0812, Japan.
  • shin@issp.u-tokyo.ac.jp

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Vol. 104, Iss. 24 — 18 June 2010

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