Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy

Laurent Nony, Adam S. Foster, Franck Bocquet, and Christian Loppacher
Phys. Rev. Lett. 103, 036802 – Published 13 July 2009

Abstract

A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a noncontact atomic force microscope simulator including a Kelvin module. The implementation mimics recent experimental results on the (001) surface of a bulk alkali halide crystal for which simultaneous atomic-scale topographical and contact potential difference contrasts were reported. The local contact potential difference does reflect the periodicity of the ionic crystal, but not the magnitude of its Madelung surface potential. The imaging mechanism relies on the induced polarization of the ions at the tip-surface interface owing to the modulation of the applied bias voltage. Our findings are in excellent agreement with previous theoretical expectations and experimental observations.

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  • Received 15 May 2009

DOI:https://doi.org/10.1103/PhysRevLett.103.036802

©2009 American Physical Society

Authors & Affiliations

Laurent Nony1,2,*, Adam S. Foster3,4, Franck Bocquet1,2, and Christian Loppacher1,2

  • 1Aix-Marseille Université, IM2NP, Avenue Normandie-Niemen, Case 151, F-13397 Marseille CEDEX 20, France
  • 2CNRS, IM2NP (UMR 6242), Marseille-Toulon, France
  • 3Department of Physics, Tampere University of Technology, P.O. Box 692, FIN-33101 Tampere, Finland
  • 4Department of Applied Physics, Helsinki University of Technology, P.O. Box 1100, FIN-02015, Finland

  • *Corresponding author. laurent.nony@im2np.fr.

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Issue

Vol. 103, Iss. 3 — 17 July 2009

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