Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy

Adam S. Foster, Clemens Barth, and Claude R. Henry
Phys. Rev. Lett. 102, 256103 – Published 26 June 2009
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Abstract

A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip’s last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.

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  • Received 30 December 2008

DOI:https://doi.org/10.1103/PhysRevLett.102.256103

©2009 American Physical Society

Authors & Affiliations

Adam S. Foster1,2, Clemens Barth3, and Claude R. Henry3

  • 1Helsinki University of Technology, Laboratory of Physics, P.O. Box 1100, 02015 Helsinki, Finland
  • 2Department of Physics, Tampere University of Technology, P.O. Box 692, 33101 Tampere, Finland
  • 3CINaM-CNRS, Campus de Luminy, Case 913, 13288 Marseille Cedex 09, France

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Issue

Vol. 102, Iss. 25 — 26 June 2009

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