Optical Near-Field Microscopy of Light Focusing through a Photonic Crystal Flat Lens

Nathalie Fabre, Loïc Lalouat, Benoit Cluzel, Xavier Mélique, Didier Lippens, Frédérique de Fornel, and Olivier Vanbésien
Phys. Rev. Lett. 101, 073901 – Published 11 August 2008

Abstract

We report here the direct observation by using a scanning near-field microscopy technique of the light focusing through a photonic crystal flat lens designed and fabricated to operate at optical frequencies. The lens is fabricated using a III-V semiconductor slab, and we directly visualize the propagation of the electromagnetic waves by using a scanning near-field optical microscope. We directly evidence spatially, as well as spectrally, the focusing operating regime of the lens. At last, in light of the experimental scanning near-field optical microscope pictures, we discuss the lens ability to focus light at a subwavelength scale.

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  • Received 13 March 2008

DOI:https://doi.org/10.1103/PhysRevLett.101.073901

©2008 American Physical Society

Authors & Affiliations

Nathalie Fabre1, Loïc Lalouat2, Benoit Cluzel2, Xavier Mélique1, Didier Lippens1, Frédérique de Fornel2, and Olivier Vanbésien1

  • 1Institut d’Electronique, de Microélectronique et de Nanotechnologie (IEMN), UMR CNRS 8520, Université des Sciences et Technologies de Lille, Cité Scientifique, BP 60069, F-59652 Villeneuve d’Ascq Cedex, France
  • 2Groupe d’Optique de Champ Proche, Institut Carnot de Bourgogne (ICB), UMR CNRS 5209, Université de Bourgogne, 9, avenue A. Savary, BP 47870, 21078 Dijon, France

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Vol. 101, Iss. 7 — 15 August 2008

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