Coherent X-Ray Diffraction Imaging with Nanofocused Illumination

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel
Phys. Rev. Lett. 101, 090801 – Published 29 August 2008

Abstract

Coherent x-ray diffraction imaging is an x-ray microscopy technique with the potential of reaching spatial resolutions well beyond the diffraction limits of x-ray microscopes based on optics. However, the available coherent dose at modern x-ray sources is limited, setting practical bounds on the spatial resolution of the technique. By focusing the available coherent flux onto the sample, the spatial resolution can be improved for radiation-hard specimens. A small gold particle (size <100nm) was illuminated with a hard x-ray nanobeam (E=15.25keV, beam dimensions 100×100nm2) and is reconstructed from its coherent diffraction pattern. A resolution of about 5 nm is achieved in 600 s exposure time.

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  • Received 26 April 2008

DOI:https://doi.org/10.1103/PhysRevLett.101.090801

©2008 American Physical Society

Authors & Affiliations

C. G. Schroer1, P. Boye1, J. M. Feldkamp1, J. Patommel1, A. Schropp1,3, A. Schwab1, S. Stephan1, M. Burghammer2, S. Schöder2, and C. Riekel2

  • 1Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
  • 2ESRF, B. P. 220, F-38043 Grenoble, France
  • 3HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg, Germany

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Issue

Vol. 101, Iss. 9 — 29 August 2008

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