Abstract
Polaron states in organic thin-film transistors (TFTs) were investigated by the electron spin resonance (ESR) technique. Gate-field-dependent and temperature-dependent single-Lorentzian ESR spectra were observed for field-induced polarons in pentacene TFTs, demonstrating the effect of motional narrowing due to polaron diffusion. Analyses of the ESR linewidth revealed a considerably long trapping time (), the variation of which is discussed in terms of the multiple trap-and-release model.
- Received 2 October 2007
DOI:https://doi.org/10.1103/PhysRevLett.100.126601
©2008 American Physical Society