Atomic-Layer Resolved Magnetic and Electronic Structure Analysis of Ni Thin Film on a Cu(001) Surface by Diffraction Spectroscopy

Fumihiko Matsui, Tomohiro Matsushita, Yukako Kato, Mie Hashimoto, Kanako Inaji, Fang Zhun Guo, and Hiroshi Daimon
Phys. Rev. Lett. 100, 207201 – Published 19 May 2008

Abstract

Up until now there has been no direct method for detecting the electronic and magnetic structure of each atomic layer at the surface, which is an essential analysis technique for nanotechnology. For this purpose, we have developed a new method, diffraction spectroscopy, based on the photon energy dependence of the angular distribution of Auger electron emission. We have applied this method to analyze the magnetic structure of a Ni ultrathin film on a Cu(001) surface around the spin reorientation transition. Atomic-layer resolved x-ray absorption and magnetic circular dichroism spectra were obtained. Surface and interior core-level shifts and magnetic moments are determined for each atomic layer individually.

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  • Received 3 February 2008

DOI:https://doi.org/10.1103/PhysRevLett.100.207201

©2008 American Physical Society

Authors & Affiliations

Fumihiko Matsui1,2,*, Tomohiro Matsushita3, Yukako Kato1, Mie Hashimoto4, Kanako Inaji1, Fang Zhun Guo3, and Hiroshi Daimon1,2

  • 1Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
  • 2CREST, Japan Science and Technology Agency (JST), Saitama 332-0012, Japan
  • 3Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Sayo, Hyogo 679-5198, Japan
  • 4Advanced Science Research Center, Japan Atomic Energy Agency (JAEA), Takasaki, Gunma 370-1292, Japan

  • *matui@ms.naist.jp

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Vol. 100, Iss. 20 — 23 May 2008

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