Theory of Multifrequency Atomic Force Microscopy

Jose R. Lozano and Ricardo Garcia
Phys. Rev. Lett. 100, 076102 – Published 20 February 2008
PDFHTMLExport Citation

Abstract

We develop a theory that explains the origin of the high force sensitivity observed in multifrequency force microscopy experiments. The ability of the microscope to extract complementary information on the surface properties is increased by the simultaneous excitation of several flexural cantilever modes. The force sensitivity in multifrequency operation is about 0.2 pN. The analytical model identifies the virial and the energy dissipated by the tip-surface forces as the parameters responsible for the material contrast. The agreement obtained among the theory, experiments and numerical simulations validates the model.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 17 October 2007

DOI:https://doi.org/10.1103/PhysRevLett.100.076102

©2008 American Physical Society

Authors & Affiliations

Jose R. Lozano and Ricardo Garcia*

  • Instituto de Microelectrónica de Madrid, CSIC, Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain

  • *rgarcia@imm.cnm.csic.es

Article Text (Subscription Required)

Click to Expand

Supplemental Material (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 100, Iss. 7 — 22 February 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×