Atomic-Scale Dynamics of the Formation and Dissolution of Carbon Clusters in SiO2

Sanwu Wang, Massimiliano Di Ventra, S. G. Kim, and Sokrates T. Pantelides
Phys. Rev. Lett. 86, 5946 – Published 25 June 2001
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Abstract

Oxidation of SiC produces SiO2 while CO is released. A “reoxidation” step at lower temperatures is, however, necessary to produce high-quality SiO2. This step is believed to cleanse the oxide of residual C without further oxidation of the SiC substrate. We report first-principles calculations that describe the nucleation and growth of O-deficient C clusters in SiO2 under oxidation conditions, fed by the production of CO at the advancing interface, and their gradual dissolution by the supply of O under reoxidation conditions. We predict that both CO and CO2 are released during both steps.

  • Received 6 February 2001

DOI:https://doi.org/10.1103/PhysRevLett.86.5946

©2001 American Physical Society

Authors & Affiliations

Sanwu Wang1,*, Massimiliano Di Ventra1,†, S. G. Kim1,‡, and Sokrates T. Pantelides1,2,§

  • 1Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235
  • 2Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831

  • *Present address: The School of Computational Science and Information Technology, and Center for Materials Research and Technology, Florida State University, Tallahassee, Florida 32306. Electronic mail: swang@csit.fsu.edu
  • Present address: Department of Physics, Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061.
  • Present address: WISEnut, Inc., Santa Clara, California 95051.
  • §Electronic mail: pantelides@vanderbilt.edu

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Vol. 86, Iss. 26 — 25 June 2001

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