Multigrid contact detection method

Kejing He, Shoubin Dong, and Zhaoyao Zhou
Phys. Rev. E 75, 036710 – Published 28 March 2007; Erratum Phys. Rev. E 75, 049902 (2007)

Abstract

Contact detection is a general problem of many physical simulations. This work presents a O(N) multigrid method for general contact detection problems (MGCD). The multigrid idea is integrated with contact detection problems. Both the time complexity and memory consumption of the MGCD are O(N). Unlike other methods, whose efficiencies are influenced strongly by the object size distribution, the performance of MGCD is insensitive to the object size distribution. We compare the MGCD with the no binary search (NBS) method and the multilevel boxing method in three dimensions for both time complexity and memory consumption. For objects with similar size, the MGCD is as good as the NBS method, both of which outperform the multilevel boxing method regarding memory consumption. For objects with diverse size, the MGCD outperform both the NBS method and the multilevel boxing method. We use the MGCD to solve the contact detection problem for a granular simulation system based on the discrete element method. From this granular simulation, we get the density property of monosize packing and binary packing with size ratio equal to 10. The packing density for monosize particles is 0.636. For binary packing with size ratio equal to 10, when the number of small particles is 300 times as the number of big particles, the maximal packing density 0.824 is achieved.

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  • Received 9 January 2007

DOI:https://doi.org/10.1103/PhysRevE.75.036710

©2007 American Physical Society

Erratum

Erratum: Multigrid contact detection method [Phys. Rev. E 75, 036710 (2007)]

Kejing He, Shoubin Dong, and Zhaoyao Zhou
Phys. Rev. E 75, 049902 (2007)

Authors & Affiliations

Kejing He* and Shoubin Dong

  • Department of Computer Science, South China University of Technology, Guangzhou 510641, China

Zhaoyao Zhou

  • Guangdong Key Laboratory for Advanced Metallic Materials Processing, South China University of Technology, Guangzhou 510641, China

  • *Corresponding author. Electronic address: kejinghe@ieee.org

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Issue

Vol. 75, Iss. 3 — March 2007

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