Local elastic constants in thin films of an fcc crystal

Kevin Van Workum and Juan J. de Pablo
Phys. Rev. E 67, 031601 – Published 11 March 2003
PDFExport Citation

Abstract

In this work we present a formalism for the calculation of the local elastic constants in inhomogeneous systems based on a method of planes. Unlike previous work, this formalism does not require the partitioning of the system into a set of finite volumes over which average elastic constants are calculated. Results for the calculation of the local elastic constants of a nearest-neighbor Lennard-Jones fcc crystal in the bulk and in a thin film are presented. The local constants are calculated at exact planes of the (001) face of the crystal. The average elastic constants of the bulk system are also computed and are consistent with the local constants. Additionally we present the local stress profiles in the thin film when a small uniaxial strain is applied. The resulting stress profile compares favorably with the stress profile predicted via the local elastic constants. The surface melting of a model for argon for which experimental and simulation data are available is also studied within the framework of this formalism.

  • Received 10 October 2002

DOI:https://doi.org/10.1103/PhysRevE.67.031601

©2003 American Physical Society

Authors & Affiliations

Kevin Van Workum and Juan J. de Pablo

  • Department of Chemical Engineering, University of Wisconsin-Madison, 1415 Engineering Drive, Madison WI 53706

References (Subscription Required)

Click to Expand
Issue

Vol. 67, Iss. 3 — March 2003

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review E

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×