Logarithmic roughening in a growth process with edge evaporation

Haye Hinrichsen
Phys. Rev. E 67, 016110 – Published 24 January 2003
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Abstract

Roughening transitions are often characterized by unusual scaling properties. As an example we investigate the roughening transition in a solid-on-solid growth process with edge evaporation [U. Alon, M. Evans, H. Hinrichsen, and D. Mukamel, Phys. Rev. Lett. 76, 2746 (1996)], where the interface is known to roughen logarithmically with time. Performing high-precision simulations we find appropriate scaling forms for various quantities. Moreover we present a simple approximation explaining why the interface roughens logarithmically.

  • Received 7 September 2002

DOI:https://doi.org/10.1103/PhysRevE.67.016110

©2003 American Physical Society

Authors & Affiliations

Haye Hinrichsen

  • Theoretische Physik, Fachbereich 8, Universität Wuppertal, 42097 Wuppertal, Germany

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Vol. 67, Iss. 1 — January 2003

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