Optical studies of the smectic-Cα* phase layer structure in free-standing films

D. A. Olson, S. Pankratz, P. M. Johnson, A. Cady, H. T. Nguyen, and C. C. Huang
Phys. Rev. E 63, 061711 – Published 24 May 2001
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Abstract

The layer structure of the smectic-Cα* phase of one liquid-crystal compound has been acquired from both differential optical reflectivity and ellipsometry measurements in the free-standing film geometry. The data from both techniques display characteristic oscillations as a function of temperature, which can be described by a model for the film consisting of surface anticlinic layers and an interior short-pitched azimuthal helix. These results are consistent with those found previously for another compound. Depolarized reflected light microscopy is used to study the films when the unique features of the aforementioned oscillations occur.

  • Received 15 November 2000

DOI:https://doi.org/10.1103/PhysRevE.63.061711

©2001 American Physical Society

Authors & Affiliations

D. A. Olson1, S. Pankratz1,*, P. M. Johnson1,†, A. Cady1, H. T. Nguyen2, and C. C. Huang1

  • 1School of Physics and Astronomy, University of Minnesota, Minneapolis, Minnesota 55455
  • 2Centre de Recherche Paul Pascal, CNRS, Université Bordeaux I, Avenue A. Schweitzer, F-33600 Pessac, France

  • *Present address: 3M Center, St. Paul, MN 55144.
  • Present address: Van der Waals-Zeeman Institute, University of Amsterdam, Amsterdam, The Netherlands.

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Vol. 63, Iss. 6 — June 2001

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