Multifractal analysis of the spatial distribution of the film surfaces with different roughening mechanisms

J. G. Hou, Wang Yan, Xia Rui, Zhu Xiaoguang, Wang Haiqian, and Z. Q. Wu
Phys. Rev. E 58, 2213 – Published 1 August 1998
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Abstract

Thin films of C60/Ag were prepared by codeposition of C60 and Ag onto (001) NaCl substrates. The surface roughness depends strongly on the substrate temperature, and a transition from kinetically roughening to thermally roughening was observed by using atomic force microscopy. Multifractal spectra of the film surfaces have been studied in the length scale of 30 nm to 5 μm. Compared with the conventional root-mean-square method, the multifractal spectrum provides more information about the spatial distribution of the surface roughness.

  • Received 31 December 1997

DOI:https://doi.org/10.1103/PhysRevE.58.2213

©1998 American Physical Society

Authors & Affiliations

J. G. Hou1, Wang Yan1, Xia Rui1, Zhu Xiaoguang2, Wang Haiqian1, and Z. Q. Wu1

  • 1Structure Research Laboratory and Hefei Advanced Research Institute, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 2Solid State Institute, Chinese Academy of Sciences, Hefei, Anhui 230026, China

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Vol. 58, Iss. 2 — August 1998

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