Cross section measurements of high-pT dilepton final-state processes using a global fitting method

A. Abulencia et al. (CDF Collaboration)
Phys. Rev. D 78, 012003 – Published 14 July 2008

Abstract

We present a new method for studying high-pT dilepton events (e±e, μ±μ, e±μ) and simultaneously extracting the production cross sections of pp¯tt¯, pp¯W+W, and pp¯Z0τ+τ at a center-of-mass energy of s=1.96TeV. We perform a likelihood fit to the dilepton data in a parameter space defined by the missing transverse energy and the number of jets in the event. Our results, which use 360pb1 of data recorded with the CDF II detector at the Fermilab Tevatron Collider, are σ(tt¯)=8.52.2+2.7pb, σ(W+W)=16.34.4+5.2pb, and σ(Z0τ+τ)=29146+50pb.

  • Figure
  • Figure
  • Received 28 December 2006

DOI:https://doi.org/10.1103/PhysRevD.78.012003

©2008 American Physical Society

Authors & Affiliations

Click to Expand

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 78, Iss. 1 — 1 July 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review D

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×