Projection phase contrast microscopy with a hard x-ray nanofocused beam: Defocus and contrast transfer

T. Salditt, K. Giewekemeyer, C. Fuhse, S. P. Krüger, R. Tucoulou, and P. Cloetens
Phys. Rev. B 79, 184112 – Published 29 May 2009
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Abstract

We report a projection phase contrast microscopy experiment using hard x-ray pink beam undulator radiation focused by an adaptive mirror system to 100–200 nm spot size. This source is used to illuminate a lithographic test pattern with a well-controlled range of spatial frequencies. The oscillatory nature of the contrast transfer function with source-to-sample distance in this holographic imaging scheme is quantified and the validity of the weak phase object approximation is confirmed for the experimental conditions.

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  • Received 14 December 2008

DOI:https://doi.org/10.1103/PhysRevB.79.184112

©2009 American Physical Society

Authors & Affiliations

T. Salditt1, K. Giewekemeyer1, C. Fuhse1, S. P. Krüger1, R. Tucoulou2, and P. Cloetens2

  • 1Institut für Röntgenphysik, Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
  • 2ESRF, BP 220, 38043 Grenoble, France

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Issue

Vol. 79, Iss. 18 — 1 May 2009

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