Electronic structure of FeSi1xGex and FeGa3 investigated by soft x-ray photoelectron spectroscopy complementary to x-ray emission spectroscopy

H. Yamaoka, M. Matsunami, R. Eguchi, Y. Ishida, N. Tsujii, Y. Takahashi, Y. Senba, H. Ohashi, and S. Shin
Phys. Rev. B 78, 045125 – Published 30 July 2008

Abstract

Soft x-ray photoelectron spectroscopy for FeSi1xGex (x=0, 0.11, 0.19, 0.26, and 0.44) and FeGa3 was performed at FeL absorption edge complementary to the x-ray emission spectroscopy. The absorption and valence-band spectra show the phase transition of the electronic state between x=0.26 and 0.44 in FeSi1xGex accompanying the narrowing of the density of state near the Fermi edge. High-resolution x-ray absorption spectra (total electron yields) at Fe2p3/2 absorption edge resolve the fine structure, originated from the valence and Auger component of electrons. Resonant valence-band and constant initial-state spectra show Fano-type profile at Fe2p3/2 absorption edge only for the x=0.44 sample but not for the x=0 sample and FeGa3. The crossover point, where the Raman and Auger features mix, is near the Fe2p absorption edge for both of the x=0 and 0.44 samples, showing the delocalized 3d states.

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  • Received 10 April 2008

DOI:https://doi.org/10.1103/PhysRevB.78.045125

©2008 American Physical Society

Authors & Affiliations

H. Yamaoka1, M. Matsunami1,2, R. Eguchi1,2, Y. Ishida1, N. Tsujii3, Y. Takahashi4, Y. Senba5, H. Ohashi5, and S. Shin1,2

  • 1Harima Institute, RIKEN (The Institute of Physical and Chemical Research), Sayo, Hyogo 679-5148, Japan
  • 2Institute of Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-85817, Japan
  • 3Quantum Beam Center, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047, Japan
  • 4University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
  • 5Japan Synchrotron Research Institute, Sayo, Hyogo 679-5148, Japan

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Issue

Vol. 78, Iss. 4 — 15 July 2008

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