Abstract
Soft x-ray photoelectron spectroscopy for (, 0.11, 0.19, 0.26, and 0.44) and was performed at absorption edge complementary to the x-ray emission spectroscopy. The absorption and valence-band spectra show the phase transition of the electronic state between and 0.44 in accompanying the narrowing of the density of state near the Fermi edge. High-resolution x-ray absorption spectra (total electron yields) at absorption edge resolve the fine structure, originated from the valence and Auger component of electrons. Resonant valence-band and constant initial-state spectra show Fano-type profile at absorption edge only for the sample but not for the sample and . The crossover point, where the Raman and Auger features mix, is near the absorption edge for both of the and 0.44 samples, showing the delocalized states.
- Received 10 April 2008
DOI:https://doi.org/10.1103/PhysRevB.78.045125
©2008 American Physical Society