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Vertical and lateral force mapping on the Si(111)(7×7) surface by dynamic force microscopy

Yoshiaki Sugimoto, Takashi Namikawa, Koutaro Miki, Masayuki Abe, and Seizo Morita
Phys. Rev. B 77, 195424 – Published 16 May 2008

Abstract

The topographic image of dynamic force microscopy (DFM) keeping the frequency shift (Δfz) constant at tiny cantilever oscillation amplitudes corresponds to the constant-vertical force (Fz) gradient surface, while the interpretation becomes complicated at larger oscillation amplitudes. We discuss how Fz and the potential energy (U) act on the tip during DFM topographic scan at various cantilever oscillation amplitudes by measuring the Δfz map on the Si(111)(7×7) surface at room temperature. The Δfz map is numerically converted into Fz and U maps. DFM topographic curves at various cantilever oscillation amplitudes are numerically derived by using the experimentally obtained Fz map. In addition, we discuss how the lateral force (Fx) acts on the tip at various tip-surface distances on various surface sites by an Fx map converted from a U map. The positions at which Fx becomes zero are identified as U minimum sites, such as the top of adatom sites, and U maximum sites (equilibrium positions of Fx), such as the center positions among three center adatoms. The tip deviated from these sites is then laterally attracted toward the U minimum sites. It is also demonstrated that lateral force microscopy performed at 1Å cantilever oscillation enables direct measurement of the lateral force gradient by numerically deriving the frequency shift (Δfx) caused by Fx.

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  • Received 20 February 2008

DOI:https://doi.org/10.1103/PhysRevB.77.195424

©2008 American Physical Society

Authors & Affiliations

Yoshiaki Sugimoto1,*, Takashi Namikawa1, Koutaro Miki1, Masayuki Abe1,2, and Seizo Morita1

  • 1Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan
  • 2PRESTO, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan

  • *ysugimoto@afm.eei.eng.osaka-u.ac.jp

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Issue

Vol. 77, Iss. 19 — 15 May 2008

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