Abstract
We have performed resonant inelastic x-ray scattering (RIXS) experiments at the edge of the Mott insulators and . Pronounced electronic excitations are observed at an energy of in both materials. These modes had been assigned to orbital excitations based on prior optical Raman scattering experiments. The present RIXS experiment strongly supports the orbital character of the excitations and confirms the great potential of high resolution soft x-ray RIXS as a probe of electronic excitations in complex materials.
- Received 27 July 2007
DOI:https://doi.org/10.1103/PhysRevB.77.113102
©2008 American Physical Society