Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior

Konstantin Iakoubovskii, Kazutaka Mitsuishi, Yoshiko Nakayama, and Kazuo Furuya
Phys. Rev. B 77, 104102 – Published 5 March 2008

Abstract

Mean free path of inelastic electron scattering λ has been measured with a 200keV transmission electron microscope for the majority of stable elemental solids and their oxides. An oscillating behavior vs atomic number Z has been revealed, such that within one row of the Periodic Table, the minimum (maximum) of λ is observed for elements with completed (empty) outer d shells. A significantly weaker λ(Z) dependence is observed for the oxides. The λ(Z) variation is ascribed to the three major factors: atomic density, number of “free” electrons per atom, and contribution of atomic core-loss transitions.

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  • Received 7 January 2008

DOI:https://doi.org/10.1103/PhysRevB.77.104102

©2008 American Physical Society

Authors & Affiliations

Konstantin Iakoubovskii* and Kazutaka Mitsuishi

  • Quantum Dot Research Center, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0005, Japan

Yoshiko Nakayama and Kazuo Furuya

  • High Voltage Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0005, Japan

  • *iakoubovskii.konstantin@nims.go.jp

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Issue

Vol. 77, Iss. 10 — 1 March 2008

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