Effects of partial coherence on correlation functions measured by x-ray photon correlation spectroscopy

C. Gutt, T. Ghaderi, M. Tolan, S. K. Sinha, and G. Grübel
Phys. Rev. B 77, 094133 – Published 26 March 2008

Abstract

We present a rigorous description of the effects of partial coherence and detector resolution on intensity autocorrelation functions as they can be measured by x-ray photon correlation spectroscopy (XPCS). Based on the Huygens-Fresnel propagation law and on the first Born approximation, we derive a general expression for the normalized intensity autocorrelation function. We calculate how the mutual coherence function of the x-ray beam propagates from an aperture to the sample and how it propagates after the scattering process to the detector area and consequently influences the intensity autocorrelation function. We illustrate our calculation with examples of XPCS intensity autocorrelation functions of liquid surfaces calculated for grazing incidence geometry.

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  • Received 11 October 2007

DOI:https://doi.org/10.1103/PhysRevB.77.094133

©2008 American Physical Society

Authors & Affiliations

C. Gutt1, T. Ghaderi2,3, M. Tolan2, S. K. Sinha3, and G. Grübel1

  • 1HASYLAB at DESY, Notkestrasse 85, Hamburg, Germany
  • 2Experimentelle Physik I, University Dortmund, Dortmund, Germany
  • 3Physics Department, University of California, San Diego, La Jolla, California 92037, USA

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Vol. 77, Iss. 9 — 1 March 2008

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