Effect of temperature and magnetic field on the thickness dependence of the critical current density of YBa2Cu3O7x films

Xiang Wang and Judy Z. Wu
Phys. Rev. B 76, 184508 – Published 8 November 2007

Abstract

In order to shed light on the puzzling thickness (t) dependence of the critical current density (Jc) in YBa2Cu3O7x (YBCO) films at 77K and self-field, we have investigated Jct behavior as a function of temperature (T) and applied magnetic field (H) in the thickness range that is within the modified Larkin length Lc. It has been found that the Jct behavior can be well described by the collective pinning (CP) model as monotonically decreasing Jct12 when thermal assisted flux motion (TAFM) is suppressed at low T close to zero. TAFM becomes increasingly important at elevated temperatures and causes deviation of the Jct from the CP model in the thickness range below the magnetic penetration depth. The deviation is more pronounced at smaller thickness and increases with T and H. Consequently, a completely reversed Jct from monotonically decreasing to monotonically increasing occurs when TAFM dominates in high T and H ranges. This result suggests that the monotonic decreasing Jct behavior is an intrinsic property of uniform YBCO films, while extrinsic effects such as material nonuniformity can greatly complicate it.

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  • Received 13 June 2007

DOI:https://doi.org/10.1103/PhysRevB.76.184508

©2007 American Physical Society

Authors & Affiliations

Xiang Wang* and Judy Z. Wu

  • Department of Physics and Astronomy, University of Kansas, Lawrence, Kansas 66045, USA

  • *Corresponding author: xiangw@ku.edu

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Issue

Vol. 76, Iss. 18 — 1 November 2007

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