X-ray resonant magnetic scattering study of magnetization reversals in a nanoscale spin-valve array

Dong Ryeol Lee, John W. Freeland, Yongseong Choi, George Srajer, Vitali Metlushko, and Bojan Ilic
Phys. Rev. B 76, 144425 – Published 19 October 2007

Abstract

We present an x-ray resonant magnetic scattering study that uses the periodicity of a patterned array of trilayer (CoCuNiFe) elements to determine not only layer-dependent magnetic hysteresis, but, more importantly, to extract the magnetization reversal in different sections of the picture-frame-shaped structure. Spatially resolved and layer-resolved magnetization measurements have revealed that magnetic switching mechanism is very distinct in different regions of the structure and results from a balancing of the shape anisotropy and strong interlayer dipolar coupling. These results demonstrate how spatially averaged measurements are not sufficient to resolve the nature of the reversal mechanism within the structure.

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  • Received 9 February 2007

DOI:https://doi.org/10.1103/PhysRevB.76.144425

©2007 American Physical Society

Authors & Affiliations

Dong Ryeol Lee1,*, John W. Freeland2, Yongseong Choi3, George Srajer2, Vitali Metlushko4, and Bojan Ilic5

  • 1Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang 790-784, Korea
  • 2Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 3Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 4Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, Illinois 60607, USA
  • 5Cornell Nanofabrication Facility, Cornell University, Ithaca, New York 14853, USA

  • *drlee@postech.ac.kr

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Vol. 76, Iss. 14 — 1 October 2007

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