Scanning tunneling microscopy fingerprints of point defects in graphene: A theoretical prediction

H. Amara, S. Latil, V. Meunier, Ph. Lambin, and J.-C. Charlier
Phys. Rev. B 76, 115423 – Published 18 September 2007

Abstract

Scanning tunneling microscopy (STM) is one of the most appropriate techniques to investigate the atomic structure of carbon nanomaterials. However, the experimental identification of topological and nontopological modifications of the hexagonal network of sp2 carbon nanostructures remains a great challenge. The goal of the present theoretical work is to predict the typical electronic features of a few defects that are likely to occur in sp2 carbon nanostructures, such as atomic vacancy, divacancy, adatom, and Stone-Wales defect. The modifications induced by those defects in the electronic properties of the graphene sheet are investigated using first-principles calculations. In addition, computed constant-current STM images of these defects are calculated within a tight-binding approach in order to facilitate the interpretation of STM images of defected carbon nanostructures.

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  • Received 19 April 2007

DOI:https://doi.org/10.1103/PhysRevB.76.115423

©2007 American Physical Society

Authors & Affiliations

H. Amara1,2, S. Latil1, V. Meunier3, Ph. Lambin1, and J.-C. Charlier2

  • 1Laboratoire de Physique du Solide, Facultés Universitaires Notre-Dame de la Paix, Rue de Bruxelles 61, 5000 Namur, Belgium
  • 2PCPM and CERMIN, Université Catholique de Louvain, Place Croix du Sud 1, 1348 Louvain-la Neuve, Belgium
  • 3Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

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Issue

Vol. 76, Iss. 11 — 15 September 2007

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