Electrostatic deflections of cantilevered semiconducting single-walled carbon nanotubes

Zhao Wang, Michel Devel, Rachel Langlet, and Bernard Dulmet
Phys. Rev. B 75, 205414 – Published 10 May 2007

Abstract

How do carbon nanotubes behave in an external electric field? What will be the relation between the intensity of the electric field and the tube’s deformation? What are the geometry effects on the response of carbon nanotubes to electric fields? To answer these questions, we have developed a computational technique combining a dipole interaction model with the AIREBO potential to study electrostatic-field induced deformations of carbon nanotubes. In this work, we find that the deflection angle of cantilevered semiconducting single-walled carbon nanotubes is proportional to the square of the electric-field strength, and the tubes can be most bent when the field angle ranges from 45° to 60° for a given weak field strength. Furthermore, the deflection angle is also found to be proportional to the aspect ratio LR. Our results provide a good qualitative agreement with those of a previous experimental study by Poncharal et al., (1999).

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  • Received 4 December 2006

DOI:https://doi.org/10.1103/PhysRevB.75.205414

©2007 American Physical Society

Authors & Affiliations

Zhao Wang1,*, Michel Devel1, Rachel Langlet2, and Bernard Dulmet3

  • 1Institut UTINAM, UMR 6213, University of Franche-Comté, 25030 Besançon Cedex, France
  • 2Laboratoire de Physique du Solide, FUNDP, Rue de Bruxelles 61, 5000 Namur, Belgium
  • 3FEMTO-ST, UMR 6174, DCEPE, ENSMM, 25030 Besançon Cedex, France

  • *Electronic address: wzzhao@yahoo.fr

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Issue

Vol. 75, Iss. 20 — 15 May 2007

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